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<http://dblp.uni-trier.de/rec/bibtex/conf/sigmetrics/1994>
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<https://dblp.l3s.de/d2r/resource/authors/Blaine_D._Gaither>
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dc:creator
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<https://dblp.l3s.de/d2r/resource/authors/Larry_W._Dowdy>
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dc:creator
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<https://dblp.l3s.de/d2r/resource/authors/Rick_Bunt>
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swrc:editor
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<https://dblp.l3s.de/d2r/resource/authors/Blaine_D._Gaither>
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swrc:editor
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<https://dblp.l3s.de/d2r/resource/authors/Larry_W._Dowdy>
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swrc:editor
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<https://dblp.l3s.de/d2r/resource/authors/Rick_Bunt>
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foaf:homepage
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<http://dx.doi.org/doi.org%2F10.1145%2F183018>
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foaf:homepage
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<https://doi.org/10.1145/183018>
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dc:identifier
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DBLP conf/sigmetrics/1994
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dc:identifier
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DOI doi.org%2F10.1145%2F183018
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dc:identifier
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ISBN 0-89791-659-X
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swrc:isbn
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ISBN 0-89791-659-X
(xsd:string)
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dcterms:issued
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1994
(xsd:gYear)
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rdfs:label
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Proceedings of the 1994 ACM SIGMETRICS conference on Measurement and modeling of computer systems, Vanderbilt University, Nashville, Tennessee, USA, May 16-20, 1994
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dc:publisher
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ACM
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owl:sameAs
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rdfs:seeAlso
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<http://amazon.com/s/ref=nb_ss_gw?field-keywords=0-89791-659-X>
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rdfs:seeAlso
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<https://doi.org/10.1145/183018>
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swrc:series
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<https://dblp.l3s.de/d2r/resource/conferences/sigmetrics>
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dcterms:tableOfContent
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<http://dblp.uni-trier.de/db/conf/sigmetrics/sigmetrics94.html>
|
dc:title
|
Proceedings of the 1994 ACM SIGMETRICS conference on Measurement and modeling of computer systems, Vanderbilt University, Nashville, Tennessee, USA, May 16-20, 1994
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swrc:Proceedings
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rdf:type
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foaf:Document
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