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<https://dblp.l3s.de/d2r/resource/authors/Blaine_D._Gaither>
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<https://dblp.l3s.de/d2r/resource/authors/Daniel_A._Reed>
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swrc:editor
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<https://dblp.l3s.de/d2r/resource/authors/Blaine_D._Gaither>
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swrc:editor
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<https://dblp.l3s.de/d2r/resource/authors/Daniel_A._Reed>
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foaf:homepage
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foaf:homepage
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DBLP conf/sigmetrics/1996
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dc:identifier
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DOI doi.org%2F10.1145%2F233013
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dc:identifier
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ISBN 0-89791-793-6
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swrc:isbn
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ISBN 0-89791-793-6
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dcterms:issued
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1996
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rdfs:label
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Proceedings of the 1996 ACM SIGMETRICS international conference on Measurement and modeling of computer systems, Philadelphia, Pennsylvania, USA, May 23-26, 1996
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dc:title
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Proceedings of the 1996 ACM SIGMETRICS international conference on Measurement and modeling of computer systems, Philadelphia, Pennsylvania, USA, May 23-26, 1996
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