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<https://dblp.l3s.de/d2r/resource/authors/Jim_Kurose>
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<https://dblp.l3s.de/d2r/resource/authors/Philippe_Nain>
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swrc:editor
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swrc:editor
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foaf:homepage
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DBLP conf/sigmetrics/2000
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dc:identifier
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DOI doi.org%2F10.1145%2F339331
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dc:identifier
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ISBN 1-58113-194-1
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ISBN 1-58113-194-1
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dcterms:issued
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2000
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rdfs:label
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Proceedings of the 2000 ACM SIGMETRICS international conference on Measurement and modeling of computer systems, Santa Clara, CA, USA, June 18-21, 2000
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rdfs:seeAlso
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dcterms:tableOfContent
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dc:title
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Proceedings of the 2000 ACM SIGMETRICS international conference on Measurement and modeling of computer systems, Santa Clara, CA, USA, June 18-21, 2000
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