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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/sigmetrics/ChangKHGHLLPKM16>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Abhijith_Kashyap>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Donghyuk_Lee>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Gennady_Pekhimenko>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hasan_Hassan>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kevin_Hsieh>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kevin_K._Chang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Onur_Mutlu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Samira_Manabi_Khan>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Saugata_Ghose>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tianshi_Li_0001>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1145%2F2896377.2901453>
foaf:homepage <https://doi.org/10.1145/2896377.2901453>
dc:identifier DBLP conf/sigmetrics/ChangKHGHLLPKM16 (xsd:string)
dc:identifier DOI doi.org%2F10.1145%2F2896377.2901453 (xsd:string)
dcterms:issued 2016 (xsd:gYear)
rdfs:label Understanding Latency Variation in Modern DRAM Chips: Experimental Characterization, Analysis, and Optimization. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Abhijith_Kashyap>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Donghyuk_Lee>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Gennady_Pekhimenko>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hasan_Hassan>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kevin_Hsieh>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kevin_K._Chang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Onur_Mutlu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Samira_Manabi_Khan>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Saugata_Ghose>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tianshi_Li_0001>
swrc:pages 323-336 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/sigmetrics/2016>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/sigmetrics/ChangKHGHLLPKM16/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/sigmetrics/ChangKHGHLLPKM16>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/sigmetrics/sigmetrics2016.html#ChangKHGHLLPKM16>
rdfs:seeAlso <https://doi.org/10.1145/2896377.2901453>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/sigmetrics>
dc:title Understanding Latency Variation in Modern DRAM Chips: Experimental Characterization, Analysis, and Optimization. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document