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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/sigsoft/YangZLZL0XL16>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Baowen_Xu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hareton_Leung>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hongmin_Lu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jinping_Liu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Lei_Xu_0003>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yangyang_Zhao>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yibiao_Yang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yuming_Zhou>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1145%2F2950290.2950353>
foaf:homepage <https://doi.org/10.1145/2950290.2950353>
dc:identifier DBLP conf/sigsoft/YangZLZL0XL16 (xsd:string)
dc:identifier DOI doi.org%2F10.1145%2F2950290.2950353 (xsd:string)
dcterms:issued 2016 (xsd:gYear)
rdfs:label Effort-aware just-in-time defect prediction: simple unsupervised models could be better than supervised models. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Baowen_Xu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hareton_Leung>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hongmin_Lu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jinping_Liu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Lei_Xu_0003>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yangyang_Zhao>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yibiao_Yang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yuming_Zhou>
swrc:pages 157-168 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/sigsoft/2016>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/sigsoft/YangZLZL0XL16/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/sigsoft/YangZLZL0XL16>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/sigsoft/fse2016.html#YangZLZL0XL16>
rdfs:seeAlso <https://doi.org/10.1145/2950290.2950353>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/sigsoft>
dc:title Effort-aware just-in-time defect prediction: simple unsupervised models could be better than supervised models. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document