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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/siu/EryilmazCATTYYG22>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Atila_Yilmaz>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Din%E2%88%9A%C3%9Fer_G%E2%88%9A%E2%88%82kcen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hakan_Tirak>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mehmet_Tilegi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Metehan_%E2%88%9A%C3%A1il>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mustafa_Eryilmaz>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sedat_Akt%E2%88%9A%C4%BErk>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Seniha_Esen_Y%E2%88%9A%C4%BEksel>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FSIU55565.2022.9864727>
foaf:homepage <https://doi.org/10.1109/SIU55565.2022.9864727>
dc:identifier DBLP conf/siu/EryilmazCATTYYG22 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FSIU55565.2022.9864727 (xsd:string)
dcterms:issued 2022 (xsd:gYear)
rdfs:label Defect Classification from Electronic Card Images by Deep Learning. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Atila_Yilmaz>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Din%E2%88%9A%C3%9Fer_G%E2%88%9A%E2%88%82kcen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hakan_Tirak>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mehmet_Tilegi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Metehan_%E2%88%9A%C3%A1il>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mustafa_Eryilmaz>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sedat_Akt%E2%88%9A%C4%BErk>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Seniha_Esen_Y%E2%88%9A%C4%BEksel>
swrc:pages 1-4 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/siu/2022>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/siu/EryilmazCATTYYG22/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/siu/EryilmazCATTYYG22>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/siu/siu2022.html#EryilmazCATTYYG22>
rdfs:seeAlso <https://doi.org/10.1109/SIU55565.2022.9864727>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/siu>
dc:title Defect Classification from Electronic Card Images by Deep Learning. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document