[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/slip/HalakSRYR08>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Alexandre_Yakovlev>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Basel_Halak>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Gordon_Russell_0002>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hiran_Ramakrishnan>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Santosh_Shedabale>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1145%2F1353610.1353624>
foaf:homepage <https://doi.org/10.1145/1353610.1353624>
dc:identifier DBLP conf/slip/HalakSRYR08 (xsd:string)
dc:identifier DOI doi.org%2F10.1145%2F1353610.1353624 (xsd:string)
dcterms:issued 2008 (xsd:gYear)
rdfs:label The impact of variability on the reliability of long on-chip interconnect in the presence of crosstalk. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Alexandre_Yakovlev>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Basel_Halak>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Gordon_Russell_0002>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hiran_Ramakrishnan>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Santosh_Shedabale>
swrc:pages 65-72 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/slip/2008>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/slip/HalakSRYR08/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/slip/HalakSRYR08>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/slip/slip2008.html#HalakSRYR08>
rdfs:seeAlso <https://doi.org/10.1145/1353610.1353624>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/slip>
dc:subject Bit Error Rate(BER), cross-talk, interconnect, variability (xsd:string)
dc:title The impact of variability on the reliability of long on-chip interconnect in the presence of crosstalk. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document