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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/slip/LiLCSC05>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chauchin_Su>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chung-Len_Lee_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jwu_E._Chen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Katherine_Shu-Min_Li>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yao-Wen_Chang>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1145%2F1053355.1053362>
foaf:homepage <https://doi.org/10.1145/1053355.1053362>
dc:identifier DBLP conf/slip/LiLCSC05 (xsd:string)
dc:identifier DOI doi.org%2F10.1145%2F1053355.1053362 (xsd:string)
dcterms:issued 2005 (xsd:gYear)
rdfs:label Multilevel full-chip routing with testability and yield enhancement. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chauchin_Su>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chung-Len_Lee_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jwu_E._Chen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Katherine_Shu-Min_Li>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yao-Wen_Chang>
swrc:pages 29-36 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/slip/2005>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/slip/LiLCSC05/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/slip/LiLCSC05>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/slip/slip2005.html#LiLCSC05>
rdfs:seeAlso <https://doi.org/10.1145/1053355.1053362>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/slip>
dc:subject multilevel routing, testability, yield (xsd:string)
dc:title Multilevel full-chip routing with testability and yield enhancement. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document