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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/slip/RajendranKSFP04>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Bipin_Rajendran>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Krishna_Saraswat>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Pawan_Kapur>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/R._Fabian_W._Pease>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1145%2F966747.966752>
foaf:homepage <https://doi.org/10.1145/966747.966752>
dc:identifier DBLP conf/slip/RajendranKSFP04 (xsd:string)
dc:identifier DOI doi.org%2F10.1145%2F966747.966752 (xsd:string)
dcterms:issued 2004 (xsd:gYear)
rdfs:label Self-consistent power/performance/reliability analysis for copper interconnects. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bipin_Rajendran>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Krishna_Saraswat>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Pawan_Kapur>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/R._Fabian_W._Pease>
swrc:pages 17-22 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/slip/2004>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/slip/RajendranKSFP04/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/slip/RajendranKSFP04>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/slip/slip2004.html#RajendranKSFP04>
rdfs:seeAlso <https://doi.org/10.1145/966747.966752>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/slip>
dc:subject Joule heating, copper interconnects, current density, duty cycle, electromigration, rent's rule (xsd:string)
dc:title Self-consistent power/performance/reliability analysis for copper interconnects. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document