Statistical characterization and modeling of random telegraph noise effects in 65nm SRAMs cells.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/smacd/Martin-Martinez17
Home
|
Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/smacd/Martin-Martinez17
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Antonio_Rubio_0001
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Francesc_Moll
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Gabriel_Torrens
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Jaume_Segura_0001
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Javier_Mart%E2%88%9A%E2%89%A0n-Mart%E2%88%9A%E2%89%A0nez
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Montserrat_Nafr%E2%88%9A%E2%89%A0a
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Rosana_Rodr%E2%88%9A%E2%89%A0guez
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Sebasti%E2%88%9A%E2%80%A0_A._Bota
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FSMACD.2017.7981610
>
foaf:
homepage
<
https://doi.org/10.1109/SMACD.2017.7981610
>
dc:
identifier
DBLP conf/smacd/Martin-Martinez17
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FSMACD.2017.7981610
(xsd:string)
dcterms:
issued
2017
(xsd:gYear)
rdfs:
label
Statistical characterization and modeling of random telegraph noise effects in 65nm SRAMs cells.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Antonio_Rubio_0001
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Francesc_Moll
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Gabriel_Torrens
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Jaume_Segura_0001
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Javier_Mart%E2%88%9A%E2%89%A0n-Mart%E2%88%9A%E2%89%A0nez
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Montserrat_Nafr%E2%88%9A%E2%89%A0a
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Rosana_Rodr%E2%88%9A%E2%89%A0guez
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Sebasti%E2%88%9A%E2%80%A0_A._Bota
>
swrc:
pages
1-4
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/smacd/2017
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/smacd/Martin-Martinez17/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/smacd/Martin-Martinez17
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/smacd/smacd2017.html#Martin-Martinez17
>
rdfs:
seeAlso
<
https://doi.org/10.1109/SMACD.2017.7981610
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/smacd
>
dc:
title
Statistical characterization and modeling of random telegraph noise effects in 65nm SRAMs cells.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document