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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/smacd/NicolaeBCBP22>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Andi_Buzo>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Corneliu_Burileanu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Georg_Pelz>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Georgian_Nicolae>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Horia_Cucu>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FSMACD55068.2022.9816218>
foaf:homepage <https://doi.org/10.1109/SMACD55068.2022.9816218>
dc:identifier DBLP conf/smacd/NicolaeBCBP22 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FSMACD55068.2022.9816218 (xsd:string)
dcterms:issued 2022 (xsd:gYear)
rdfs:label Manufacturing Variation Estimation of On Resistance in Power Semiconductors. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Andi_Buzo>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Corneliu_Burileanu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Georg_Pelz>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Georgian_Nicolae>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Horia_Cucu>
swrc:pages 1-4 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/smacd/2022>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/smacd/NicolaeBCBP22/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/smacd/NicolaeBCBP22>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/smacd/smacd2022.html#NicolaeBCBP22>
rdfs:seeAlso <https://doi.org/10.1109/SMACD55068.2022.9816218>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/smacd>
dc:title Manufacturing Variation Estimation of On Resistance in Power Semiconductors. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document