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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/smacd/VardarZJMLDK23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Alptekin_Vardar>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Li_Zhang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Nellie_Laleni>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Saiyam_Bherulal_Jain>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shaown_Mojumder>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sourav_De>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Thomas_K%E2%88%9A%C2%A7mpfe>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FSMACD58065.2023.10192126>
foaf:homepage <https://doi.org/10.1109/SMACD58065.2023.10192126>
dc:identifier DBLP conf/smacd/VardarZJMLDK23 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FSMACD58065.2023.10192126 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
rdfs:label The True Cost of Errors in Emerging Memory Devices: A Worst-Case Analysis of Device Errors in IMC for Safety-Critical Applications. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Alptekin_Vardar>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Li_Zhang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Nellie_Laleni>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Saiyam_Bherulal_Jain>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shaown_Mojumder>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sourav_De>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Thomas_K%E2%88%9A%C2%A7mpfe>
swrc:pages 1-4 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/smacd/2023>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/smacd/VardarZJMLDK23/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/smacd/VardarZJMLDK23>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/smacd/smacd2023.html#VardarZJMLDK23>
rdfs:seeAlso <https://doi.org/10.1109/SMACD58065.2023.10192126>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/smacd>
dc:title The True Cost of Errors in Emerging Memory Devices: A Worst-Case Analysis of Device Errors in IMC for Safety-Critical Applications. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document