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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/smc/LiCJJ10>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chuan-Yu_Chang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/ChunHsi_Li>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/MuDer_Jeng>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yang-Ting_Jeng>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FICSMC.2010.5642506>
foaf:homepage <https://doi.org/10.1109/ICSMC.2010.5642506>
dc:identifier DBLP conf/smc/LiCJJ10 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FICSMC.2010.5642506 (xsd:string)
dcterms:issued 2010 (xsd:gYear)
rdfs:label A case study of applying regional level-set formulation to post-sawing LED wafer inspection. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chuan-Yu_Chang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/ChunHsi_Li>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/MuDer_Jeng>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yang-Ting_Jeng>
swrc:pages 2745-2752 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/smc/2010>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/smc/LiCJJ10/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/smc/LiCJJ10>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/smc/smc2010.html#LiCJJ10>
rdfs:seeAlso <https://doi.org/10.1109/ICSMC.2010.5642506>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/smc>
dc:title A case study of applying regional level-set formulation to post-sawing LED wafer inspection. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document