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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/snpd/ChenYCC06>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chan-Chine_Chang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/H._H._Chien>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kun-Chieh_Yeh>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ruey-Shun_Chen>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FSNPD-SAWN.2006.75>
foaf:homepage <https://doi.org/10.1109/SNPD-SAWN.2006.75>
dc:identifier DBLP conf/snpd/ChenYCC06 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FSNPD-SAWN.2006.75 (xsd:string)
dcterms:issued 2006 (xsd:gYear)
rdfs:label Using Data Mining Technology to improve Manufacturing Quality - A Case Study of LCD Driver IC Packaging Industry. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chan-Chine_Chang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/H._H._Chien>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kun-Chieh_Yeh>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ruey-Shun_Chen>
swrc:pages 115-119 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/snpd/2006>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/snpd/ChenYCC06/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/snpd/ChenYCC06>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/snpd/snpd2006.html#ChenYCC06>
rdfs:seeAlso <https://doi.org/10.1109/SNPD-SAWN.2006.75>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/snpd>
dc:subject LCD driver IC packaging, Data warehouse, Data mining, Decision tree. (xsd:string)
dc:title Using Data Mining Technology to improve Manufacturing Quality - A Case Study of LCD Driver IC Packaging Industry. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document