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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/socc/KimNK05>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Edwin_C._Kan>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jinsook_Kim>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Weiping_Ni>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FSOCC.2005.1554495>
foaf:homepage <https://doi.org/10.1109/SOCC.2005.1554495>
dc:identifier DBLP conf/socc/KimNK05 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FSOCC.2005.1554495 (xsd:string)
dcterms:issued 2005 (xsd:gYear)
rdfs:label Resistive Loss and Trans-Impedance Characterization of Nonlinear Transmission Lines on CMOS SOI Substrate. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Edwin_C._Kan>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jinsook_Kim>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Weiping_Ni>
swrc:pages 203-206 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/socc/2005>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/socc/KimNK05/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/socc/KimNK05>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/socc/socc2005.html#KimNK05>
rdfs:seeAlso <https://doi.org/10.1109/SOCC.2005.1554495>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/socc>
dc:title Resistive Loss and Trans-Impedance Characterization of Nonlinear Transmission Lines on CMOS SOI Substrate. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document