Failure analysis for ultra low power nano-CMOS SRAM under process variations.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/socc/SinghMPM08a
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dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/socc/SinghMPM08a
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Dhiraj_K._Pradhan
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Jawar_Singh
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Jimson_Mathew
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Saraju_P._Mohanty
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FSOCC.2008.4641522
>
foaf:
homepage
<
https://doi.org/10.1109/SOCC.2008.4641522
>
dc:
identifier
DBLP conf/socc/SinghMPM08a
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FSOCC.2008.4641522
(xsd:string)
dcterms:
issued
2008
(xsd:gYear)
rdfs:
label
Failure analysis for ultra low power nano-CMOS SRAM under process variations.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Dhiraj_K._Pradhan
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Jawar_Singh
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Jimson_Mathew
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Saraju_P._Mohanty
>
swrc:
pages
251-254
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/socc/2008
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/socc/SinghMPM08a/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/socc/SinghMPM08a
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/socc/socc2008.html#SinghMPM08a
>
rdfs:
seeAlso
<
https://doi.org/10.1109/SOCC.2008.4641522
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/socc
>
dc:
title
Failure analysis for ultra low power nano-CMOS SRAM under process variations.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document