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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/springsim/HanLJ09>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chilgee_Lee>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jason_J._Jung>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Youngshin_Han>
foaf:homepage <http://dl.acm.org/citation.cfm?id=1639809.1639945>
foaf:homepage <http://dx.doi.org/10.1109%2FMDT.1985.294737>
dc:identifier DBLP conf/springsim/HanLJ09 (xsd:string)
dc:identifier DOI 10.1109%2FMDT.1985.294737 (xsd:string)
dcterms:issued 2009 (xsd:gYear)
rdfs:label Redundancy analysis simulation in semiconductor manufacturing for yield improvement. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chilgee_Lee>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jason_J._Jung>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Youngshin_Han>
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/springsim/2009>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/springsim/HanLJ09/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/springsim/HanLJ09>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/springsim/springsim2009.html#HanLJ09>
rdfs:seeAlso <http://dl.acm.org/citation.cfm?id=1639809.1639945>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/springsim>
dc:subject EDS, correlation, fail bit map, redundancy analysis simulation (xsd:string)
dc:title Redundancy analysis simulation in semiconductor manufacturing for yield improvement. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document