[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ssiai/Schaper02>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Daniel_Schaper>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FIAI.2002.999888>
foaf:homepage <https://doi.org/10.1109/IAI.2002.999888>
dc:identifier DBLP conf/ssiai/Schaper02 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FIAI.2002.999888 (xsd:string)
dcterms:issued 2002 (xsd:gYear)
rdfs:label Automated Quality Control for Micro-Technology Components Using a Depth from Focus Approach. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Daniel_Schaper>
swrc:pages 50- (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ssiai/2002>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ssiai/Schaper02/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ssiai/Schaper02>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ssiai/ssiai2002.html#Schaper02>
rdfs:seeAlso <https://doi.org/10.1109/IAI.2002.999888>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ssiai>
dc:subject quality control; depth from focus (xsd:string)
dc:title Automated Quality Control for Micro-Technology Components Using a Depth from Focus Approach. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document