Synthesis for Testability: Binary Decision Diagrams. | D2R Server publishing the DBLP Bibliography Database, hosted at L3S Research Center

Property	Value
dcterms:bibliographicCitation	<http://dblp.uni-trier.de/rec/bibtex/conf/stacs/Becker92>
dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Bernd_Becker_0001>
foaf:homepage	<http://dx.doi.org/doi.org%2F10.1007%2F3-540-55210-3%5F208>
foaf:homepage	<https://doi.org/10.1007/3-540-55210-3_208>
dc:identifier	DBLP conf/stacs/Becker92 (xsd:string)
dc:identifier	DOI doi.org%2F10.1007%2F3-540-55210-3%5F208 (xsd:string)
dcterms:issued	1992 (xsd:gYear)
rdfs:label	Synthesis for Testability: Binary Decision Diagrams. (xsd:string)
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/Bernd_Becker_0001>
swrc:pages	501-512 (xsd:string)
dcterms:partOf	<https://dblp.l3s.de/d2r/resource/publications/conf/stacs/1992>
owl:sameAs	<http://bibsonomy.org/uri/bibtexkey/conf/stacs/Becker92/dblp>
owl:sameAs	<http://dblp.rkbexplorer.com/id/conf/stacs/Becker92>
rdfs:seeAlso	<http://dblp.uni-trier.de/db/conf/stacs/stacs92.html#Becker92>
rdfs:seeAlso	<https://doi.org/10.1007/3-540-55210-3_208>
swrc:series	<https://dblp.l3s.de/d2r/resource/conferences/stacs>
dc:subject	VLSI structures; algorithms and data structures; synthesis; (complete, full) testability; fault model (xsd:string)
dc:title	Synthesis for Testability: Binary Decision Diagrams. (xsd:string)
dc:type	<http://purl.org/dc/dcmitype/Text>
rdf:type	swrc:InProceedings
rdf:type	foaf:Document