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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/stoc/SaxenaS11>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/C._Seshadhri_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Nitin_Saxena_0001>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1145%2F1993636.1993694>
foaf:homepage <https://doi.org/10.1145/1993636.1993694>
dc:identifier DBLP conf/stoc/SaxenaS11 (xsd:string)
dc:identifier DOI doi.org%2F10.1145%2F1993636.1993694 (xsd:string)
dcterms:issued 2011 (xsd:gYear)
rdfs:label Blackbox identity testing for bounded top fanin depth-3 circuits: the field doesn't matter. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/C._Seshadhri_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Nitin_Saxena_0001>
swrc:pages 431-440 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/stoc/2011>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/stoc/SaxenaS11/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/stoc/SaxenaS11>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/stoc/stoc2011.html#SaxenaS11>
rdfs:seeAlso <https://doi.org/10.1145/1993636.1993694>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/stoc>
dc:title Blackbox identity testing for bounded top fanin depth-3 circuits: the field doesn't matter. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document