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foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2F978-3-319-97807-9>
foaf:homepage <https://doi.org/10.1007/978-3-319-97807-9>
dc:identifier DBLP conf/tea/2017 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2F978-3-319-97807-9 (xsd:string)
dc:identifier ISBN 978-3-319-97806-2 (xsd:string)
swrc:isbn ISBN 978-3-319-97806-2 (xsd:string)
dcterms:issued 2018 (xsd:gYear)
rdfs:label Technology Enhanced Assessment, 20th International Conference, TEA 2017, Barcelona, Spain, October 5-6, 2017, Revised Selected Papers. (xsd:string)
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dc:publisher Springer (xsd:string)
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dc:title Technology Enhanced Assessment, 20th International Conference, TEA 2017, Barcelona, Spain, October 5-6, 2017, Revised Selected Papers. (xsd:string)
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rdf:type foaf:Document
swrc:volume 829 (xsd:string)