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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/tencon/ShimizuFHSHT23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Atsuya_Fujiwara>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Haruki_Hayashi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hirohisa_Taguchi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kazuaki_Hirana>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Soichi_Sano>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yuki_Shimizu>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTENCON58879.2023.10322353>
foaf:homepage <https://doi.org/10.1109/TENCON58879.2023.10322353>
dc:identifier DBLP conf/tencon/ShimizuFHSHT23 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTENCON58879.2023.10322353 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
rdfs:label Methodology for Evaluating 2DEG Carrier Behavior in High-Frequency Bands in AlGaN/GaN HEMTs. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Atsuya_Fujiwara>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Haruki_Hayashi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hirohisa_Taguchi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kazuaki_Hirana>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Soichi_Sano>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yuki_Shimizu>
swrc:pages 570-574 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/tencon/2023>
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rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/tencon/tencon2023.html#ShimizuFHSHT23>
rdfs:seeAlso <https://doi.org/10.1109/TENCON58879.2023.10322353>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/tencon>
dc:title Methodology for Evaluating 2DEG Carrier Behavior in High-Frequency Bands in AlGaN/GaN HEMTs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document