[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/uemcom/CollierLSPBLL23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Davis_C._Loose>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Elvie_Sellers>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Igor_Linkov>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/James_H._Lambert>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Madhur_Behl>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Thomas_L._Polmateer>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Zachary_A._Collier>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FUEMCON59035.2023.10315988>
foaf:homepage <https://doi.org/10.1109/UEMCON59035.2023.10315988>
dc:identifier DBLP conf/uemcom/CollierLSPBLL23 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FUEMCON59035.2023.10315988 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
rdfs:label Stress Testing for Resilience of Semiconductor Supply Chains. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Davis_C._Loose>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Elvie_Sellers>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Igor_Linkov>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/James_H._Lambert>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Madhur_Behl>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Thomas_L._Polmateer>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Zachary_A._Collier>
swrc:pages 42-49 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/uemcom/2023>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/uemcom/CollierLSPBLL23/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/uemcom/CollierLSPBLL23>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/uemcom/uemcom2023.html#CollierLSPBLL23>
rdfs:seeAlso <https://doi.org/10.1109/UEMCON59035.2023.10315988>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/uemcom>
dc:title Stress Testing for Resilience of Semiconductor Supply Chains. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document