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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/uv/ChenWLDL22>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ling_Chen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yaman_Wang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yanyan_Li>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yuchen_Long>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Zengfeng_Duan>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FUV56588.2022.10185477>
foaf:homepage <https://doi.org/10.1109/UV56588.2022.10185477>
dc:identifier DBLP conf/uv/ChenWLDL22 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FUV56588.2022.10185477 (xsd:string)
dcterms:issued 2022 (xsd:gYear)
rdfs:label Research and Development of Intelligent Tests and a Process Design System for Complex and Precision Parts of Electronic Products. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ling_Chen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yaman_Wang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yanyan_Li>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yuchen_Long>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Zengfeng_Duan>
swrc:pages 1-7 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/uv/2022>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/uv/ChenWLDL22/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/uv/ChenWLDL22>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/uv/uv2022.html#ChenWLDL22>
rdfs:seeAlso <https://doi.org/10.1109/UV56588.2022.10185477>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/uv>
dc:title Research and Development of Intelligent Tests and a Process Design System for Complex and Precision Parts of Electronic Products. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document