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<http://dblp.uni-trier.de/rec/bibtex/conf/vdat/2022>
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<https://dblp.l3s.de/d2r/resource/authors/Ambika_Prasad_Shah>
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swrc:editor
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foaf:homepage
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<http://dx.doi.org/doi.org%2F10.1007%2F978-3-031-21514-8>
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foaf:homepage
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<https://doi.org/10.1007/978-3-031-21514-8>
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dc:identifier
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DBLP conf/vdat/2022
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dc:identifier
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DOI doi.org%2F10.1007%2F978-3-031-21514-8
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dc:identifier
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ISBN 978-3-031-21513-1
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swrc:isbn
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ISBN 978-3-031-21513-1
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dcterms:issued
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2022
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rdfs:label
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VLSI Design and Test - 26th International Symposium, VDAT 2022, Jammu, India, July 17-19, 2022, Revised Selected Papers
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dc:publisher
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Springer
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<http://dblp.uni-trier.de/db/conf/vdat/vdat2022.html>
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dc:title
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VLSI Design and Test - 26th International Symposium, VDAT 2022, Jammu, India, July 17-19, 2022, Revised Selected Papers
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swrc:Proceedings
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foaf:Document
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swrc:volume
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1687
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