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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vdat/GuptaBBBDBC22>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Anand_Bulusu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Aniket_Gupta>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Govind_Bajpai>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Navjeet_Bagga>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Nitanshu_Chauhan>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shashank_Banchhor>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sudeb_Dasgupta>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2F978-3-031-21514-8%5F8>
foaf:homepage <https://doi.org/10.1007/978-3-031-21514-8_8>
dc:identifier DBLP conf/vdat/GuptaBBBDBC22 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2F978-3-031-21514-8%5F8 (xsd:string)
dcterms:issued 2022 (xsd:gYear)
rdfs:label Unveiling the Impact of Interface Traps Induced on Negative Capacitance Nanosheet FET: A Reliability Perspective. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Anand_Bulusu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Aniket_Gupta>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Govind_Bajpai>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Navjeet_Bagga>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Nitanshu_Chauhan>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shashank_Banchhor>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sudeb_Dasgupta>
swrc:pages 85-96 (xsd:string)
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rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vdat/vdat2022.html#GuptaBBBDBC22>
rdfs:seeAlso <https://doi.org/10.1007/978-3-031-21514-8_8>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vdat>
dc:title Unveiling the Impact of Interface Traps Induced on Negative Capacitance Nanosheet FET: A Reliability Perspective. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document