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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/visapp/KalberKLR21>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Florian_K%E2%88%9A%C2%A7lber>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Gerhard_Rigoll>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Nicolas_H._Lehment>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Okan_K%E2%88%9A%E2%88%82p%E2%88%9A%C4%BEkl%E2%88%9A%C4%BE>
foaf:homepage <http://dx.doi.org/doi.org%2F10.5220%2F0010320205930601>
foaf:homepage <https://doi.org/10.5220/0010320205930601>
dc:identifier DBLP conf/visapp/KalberKLR21 (xsd:string)
dc:identifier DOI doi.org%2F10.5220%2F0010320205930601 (xsd:string)
dcterms:issued 2021 (xsd:gYear)
rdfs:label U-Net based Zero-hour Defect Inspection of Electronic Components and Semiconductors. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Florian_K%E2%88%9A%C2%A7lber>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Gerhard_Rigoll>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Nicolas_H._Lehment>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Okan_K%E2%88%9A%E2%88%82p%E2%88%9A%C4%BEkl%E2%88%9A%C4%BE>
swrc:pages 593-601 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/visapp/2021-2>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/visapp/KalberKLR21/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/visapp/KalberKLR21>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/visapp/visapp2021-2.html#KalberKLR21>
rdfs:seeAlso <https://doi.org/10.5220/0010320205930601>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/visapp>
dc:title U-Net based Zero-hour Defect Inspection of Electronic Components and Semiconductors. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document