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dcterms:bibliographicCitation
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<http://dblp.uni-trier.de/rec/bibtex/conf/vlsi-dat/2021>
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foaf:homepage
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<http://dx.doi.org/doi.org%2F10.1109%2FVLSI-DAT52063.2021>
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foaf:homepage
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<https://doi.org/10.1109/VLSI-DAT52063.2021>
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dc:identifier
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DBLP conf/vlsi-dat/2021
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dc:identifier
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DOI doi.org%2F10.1109%2FVLSI-DAT52063.2021
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dc:identifier
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ISBN 978-1-6654-1915-4
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swrc:isbn
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ISBN 978-1-6654-1915-4
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dcterms:issued
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2021
(xsd:gYear)
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rdfs:label
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International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2021, Hsinchu, Taiwan, April 19-22, 2021
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<https://dblp.l3s.de/d2r/resource/publications/conf/vlsi-dat/Chen21>
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<https://dblp.l3s.de/d2r/resource/publications/conf/vlsi-dat/ChenCTL21>
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<https://dblp.l3s.de/d2r/resource/publications/conf/vlsi-dat/ChenLYTKW21>
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dc:publisher
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IEEE
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rdfs:seeAlso
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rdfs:seeAlso
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<https://doi.org/10.1109/VLSI-DAT52063.2021>
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swrc:series
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<https://dblp.l3s.de/d2r/resource/conferences/vlsi-dat>
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dcterms:tableOfContent
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<http://dblp.uni-trier.de/db/conf/vlsi-dat/vlsi-dat2021.html>
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dc:title
|
International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2021, Hsinchu, Taiwan, April 19-22, 2021
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swrc:Proceedings
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foaf:Document
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