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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vlsi-dat/LetchumananTGW18>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sai_Leong_Wong>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Subagaran_Letchumanan>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Terrence_Huat_Hin_Tan>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yee_Pheng_Gan>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVLSI-DAT.2018.8373239>
foaf:homepage <https://doi.org/10.1109/VLSI-DAT.2018.8373239>
dc:identifier DBLP conf/vlsi-dat/LetchumananTGW18 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVLSI-DAT.2018.8373239 (xsd:string)
dcterms:issued 2018 (xsd:gYear)
rdfs:label Adaptive test method on production system-level testing (SLT) to optimize test cost, resources and defect parts per million (DPPM). (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sai_Leong_Wong>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Subagaran_Letchumanan>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Terrence_Huat_Hin_Tan>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yee_Pheng_Gan>
swrc:pages 1-3 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vlsi-dat/2018>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vlsi-dat/LetchumananTGW18/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vlsi-dat/LetchumananTGW18>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vlsi-dat/vlsi-dat2018.html#LetchumananTGW18>
rdfs:seeAlso <https://doi.org/10.1109/VLSI-DAT.2018.8373239>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vlsi-dat>
dc:title Adaptive test method on production system-level testing (SLT) to optimize test cost, resources and defect parts per million (DPPM). (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document