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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vlsi-dat/LinderCKW13>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Barry_P._Linder>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Eduard_Cartier>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ernest_Y._Wu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/S._Krishnan>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVLDI-DAT.2013.6533828>
foaf:homepage <https://doi.org/10.1109/VLDI-DAT.2013.6533828>
dc:identifier DBLP conf/vlsi-dat/LinderCKW13 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVLDI-DAT.2013.6533828 (xsd:string)
dcterms:issued 2013 (xsd:gYear)
rdfs:label Improving and optimizing reliability in future technologies with high-őļ dielectrics. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Barry_P._Linder>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Eduard_Cartier>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ernest_Y._Wu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/S._Krishnan>
swrc:pages 1-4 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vlsi-dat/2013>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vlsi-dat/LinderCKW13/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vlsi-dat/LinderCKW13>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vlsi-dat/vlsi-dat2013.html#LinderCKW13>
rdfs:seeAlso <https://doi.org/10.1109/VLDI-DAT.2013.6533828>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vlsi-dat>
dc:title Improving and optimizing reliability in future technologies with high-őļ dielectrics. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document