TSV-aware 3D test wrapper chain optimization.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/vlsi-dat/WuH18
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Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/vlsi-dat/WuH18
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Shih-Hsu_Huang
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Yu-Yi_Wu
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FVLSI-DAT.2018.8373262
>
foaf:
homepage
<
https://doi.org/10.1109/VLSI-DAT.2018.8373262
>
dc:
identifier
DBLP conf/vlsi-dat/WuH18
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FVLSI-DAT.2018.8373262
(xsd:string)
dcterms:
issued
2018
(xsd:gYear)
rdfs:
label
TSV-aware 3D test wrapper chain optimization.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Shih-Hsu_Huang
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Yu-Yi_Wu
>
swrc:
pages
1-4
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/vlsi-dat/2018
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/vlsi-dat/WuH18/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/vlsi-dat/WuH18
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/vlsi-dat/vlsi-dat2018.html#WuH18
>
rdfs:
seeAlso
<
https://doi.org/10.1109/VLSI-DAT.2018.8373262
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/vlsi-dat
>
dc:
title
TSV-aware 3D test wrapper chain optimization.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document