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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vlsi-dat/WuK22>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/I-Hsuan_Wu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ming-Dou_Ker>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVLSI-DAT54769.2022.9768083>
foaf:homepage <https://doi.org/10.1109/VLSI-DAT54769.2022.9768083>
dc:identifier DBLP conf/vlsi-dat/WuK22 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVLSI-DAT54769.2022.9768083 (xsd:string)
dcterms:issued 2022 (xsd:gYear)
rdfs:label Single Chip of Electrostatic Discharge Detector for IC Manufacturing Field Control. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/I-Hsuan_Wu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ming-Dou_Ker>
swrc:pages 1-4 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vlsi-dat/2022>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vlsi-dat/WuK22/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vlsi-dat/WuK22>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vlsi-dat/vlsi-dat2022.html#WuK22>
rdfs:seeAlso <https://doi.org/10.1109/VLSI-DAT54769.2022.9768083>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vlsi-dat>
dc:title Single Chip of Electrostatic Discharge Detector for IC Manufacturing Field Control. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document