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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vlsi/CopettiMPB17>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Guilherme_Cardoso_Medeiros>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Let%E2%88%9A%E2%89%A0cia_Maria_Bolzani_Poehls>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Thiago_Santos_Copetti>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tiago_R._Balen>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2F978-3-030-15663-3%5F2>
foaf:homepage <https://doi.org/10.1007/978-3-030-15663-3_2>
dc:identifier DBLP conf/vlsi/CopettiMPB17 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2F978-3-030-15663-3%5F2 (xsd:string)
dcterms:issued 2017 (xsd:gYear)
rdfs:label Evaluating the Impact of Resistive Defects on FinFET-Based SRAMs. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Guilherme_Cardoso_Medeiros>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Let%E2%88%9A%E2%89%A0cia_Maria_Bolzani_Poehls>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Thiago_Santos_Copetti>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tiago_R._Balen>
swrc:pages 22-45 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vlsi/2017socs>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vlsi/CopettiMPB17/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vlsi/CopettiMPB17>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vlsi/vlsisoc2017s.html#CopettiMPB17>
rdfs:seeAlso <https://doi.org/10.1007/978-3-030-15663-3_2>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vlsi>
dc:title Evaluating the Impact of Resistive Defects on FinFET-Based SRAMs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document