Statistical analysis of systematic and random variability of flip-flop race immunity in 130nm and 90nm CMOS technologies.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/vlsi/NeubergerKRWBP07
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Statistical analysis of systematic and random variability of flip-flop race immunity in 130nm and 90nm CMOS technologies.
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Statistical analysis of systematic and random variability of flip-flop race immunity in 130nm and 90nm CMOS technologies.
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