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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vlsi/OyeniranUJR19a>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Adeboye_Stephen_Oyeniran>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jaan_Raik>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Maksim_Jenihhin>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Raimund_Ubar>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2F978-3-030-53273-4%5F2>
foaf:homepage <https://doi.org/10.1007/978-3-030-53273-4_2>
dc:identifier DBLP conf/vlsi/OyeniranUJR19a (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2F978-3-030-53273-4%5F2 (xsd:string)
dcterms:issued 2019 (xsd:gYear)
rdfs:label On Test Generation for Microprocessors for Extended Class of Functional Faults. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Adeboye_Stephen_Oyeniran>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jaan_Raik>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Maksim_Jenihhin>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Raimund_Ubar>
swrc:pages 21-44 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vlsi/2019socs>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vlsi/OyeniranUJR19a/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vlsi/OyeniranUJR19a>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vlsi/vlsisoc2019s.html#OyeniranUJR19a>
rdfs:seeAlso <https://doi.org/10.1007/978-3-030-53273-4_2>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vlsi>
dc:title On Test Generation for Microprocessors for Extended Class of Functional Faults. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document