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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vlsi/PapanikolaouMWCSMKBT06>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Antonis_Papanikolaou>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ben_Kaczer>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/C._Bruynseraede>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Francky_Catthoor>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hua_Wang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/M._Satyakiran>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Miguel_Miranda>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Pol_Marchal>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Zsolt_Tokei>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVLSISOC.2006.313258>
foaf:homepage <https://doi.org/10.1109/VLSISOC.2006.313258>
dc:identifier DBLP conf/vlsi/PapanikolaouMWCSMKBT06 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVLSISOC.2006.313258 (xsd:string)
dcterms:issued 2006 (xsd:gYear)
rdfs:label Reliability issues in deep deep sub-micron technologies: time-dependent variability and its impact on embedded system design. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Antonis_Papanikolaou>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ben_Kaczer>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/C._Bruynseraede>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Francky_Catthoor>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hua_Wang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/M._Satyakiran>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Miguel_Miranda>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Pol_Marchal>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Zsolt_Tokei>
swrc:pages 342-347 (xsd:string)
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rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vlsi/vlsisoc2006.html#PapanikolaouMWCSMKBT06>
rdfs:seeAlso <https://doi.org/10.1109/VLSISOC.2006.313258>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vlsi>
dc:title Reliability issues in deep deep sub-micron technologies: time-dependent variability and its impact on embedded system design. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document