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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vlsi/SchvittzFRB19>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Denis_Teixeira_Franco>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Leomar_S._da_Rosa>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Paulo_F._Butzen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Rafael_B._Schvittz>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2F978-3-030-53273-4%5F4>
foaf:homepage <https://doi.org/10.1007/978-3-030-53273-4_4>
dc:identifier DBLP conf/vlsi/SchvittzFRB19 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2F978-3-030-53273-4%5F4 (xsd:string)
dcterms:issued 2019 (xsd:gYear)
rdfs:label An Improved Technique for Logic Gate Susceptibility Evaluation of Single Event Transient Faults. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Denis_Teixeira_Franco>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Leomar_S._da_Rosa>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Paulo_F._Butzen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Rafael_B._Schvittz>
swrc:pages 69-88 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vlsi/2019socs>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vlsi/SchvittzFRB19/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vlsi/SchvittzFRB19>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vlsi/vlsisoc2019s.html#SchvittzFRB19>
rdfs:seeAlso <https://doi.org/10.1007/978-3-030-53273-4_4>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vlsi>
dc:title An Improved Technique for Logic Gate Susceptibility Evaluation of Single Event Transient Faults. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document