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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vlsic/BooCKLKLA20>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Gil-Cho_Ahn>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ho-Jin_Kim>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jae-Geun_Lim>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jun-Ho_Boo>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kang-Il_Cho>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Seung-Hoon_Lee>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yong-Sik_Kwak>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVLSICircuits18222.2020.9162987>
foaf:homepage <https://doi.org/10.1109/VLSICircuits18222.2020.9162987>
dc:identifier DBLP conf/vlsic/BooCKLKLA20 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVLSICircuits18222.2020.9162987 (xsd:string)
dcterms:issued 2020 (xsd:gYear)
rdfs:label A Single-Trim Switched Capacitor CMOS Bandgap Reference with a 3ŌÉ Inaccuracy of +0.02%, -0.12% for Battery Monitoring Applications. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Gil-Cho_Ahn>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ho-Jin_Kim>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jae-Geun_Lim>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jun-Ho_Boo>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kang-Il_Cho>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Seung-Hoon_Lee>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yong-Sik_Kwak>
swrc:pages 1-2 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vlsic/2020>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vlsic/BooCKLKLA20/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vlsic/BooCKLKLA20>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vlsic/vlsic2020.html#BooCKLKLA20>
rdfs:seeAlso <https://doi.org/10.1109/VLSICircuits18222.2020.9162987>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vlsic>
dc:title A Single-Trim Switched Capacitor CMOS Bandgap Reference with a 3ŌÉ Inaccuracy of +0.02%, -0.12% for Battery Monitoring Applications. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document