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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vlsid/AainBD96>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/A._H._Bratt>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/A._P._Dorey>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Abu_Khari_bin_A%27Ain>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FICVD.1996.489492>
foaf:homepage <https://doi.org/10.1109/ICVD.1996.489492>
dc:identifier DBLP conf/vlsid/AainBD96 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FICVD.1996.489492 (xsd:string)
dcterms:issued 1996 (xsd:gYear)
rdfs:label Testing Analogue Circuits by A C Power Supply Voltage. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/A._H._Bratt>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/A._P._Dorey>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Abu_Khari_bin_A%27Ain>
swrc:pages 238-241 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vlsid/1996>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vlsid/AainBD96/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vlsid/AainBD96>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vlsid/vlsid1996.html#AainBD96>
rdfs:seeAlso <https://doi.org/10.1109/ICVD.1996.489492>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vlsid>
dc:subject Fault model, analogue test, low voltage test (xsd:string)
dc:title Testing Analogue Circuits by A C Power Supply Voltage. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document