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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vlsid/AgrawalBKS03>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Dong_Hyun_Baik>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kewal_K._Saluja>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Vishwani_D._Agrawal>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yong_Chang_Kim>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FICVD.2003.1183128>
foaf:homepage <https://doi.org/10.1109/ICVD.2003.1183128>
dc:identifier DBLP conf/vlsid/AgrawalBKS03 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FICVD.2003.1183128 (xsd:string)
dcterms:issued 2003 (xsd:gYear)
rdfs:label Exclusive Test and its Applications to Fault Diagnosis. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Dong_Hyun_Baik>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kewal_K._Saluja>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Vishwani_D._Agrawal>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yong_Chang_Kim>
swrc:pages 143-148 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vlsid/2003>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vlsid/AgrawalBKS03/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vlsid/AgrawalBKS03>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vlsid/vlsid2003.html#AgrawalBKS03>
rdfs:seeAlso <https://doi.org/10.1109/ICVD.2003.1183128>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vlsid>
dc:title Exclusive Test and its Applications to Fault Diagnosis. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document