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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vlsid/BanerjeeCR96>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Rabindra_K._Roy>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Savita_Banerjee>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Srimat_T._Chakradhar>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FICVD.1996.489481>
foaf:homepage <https://doi.org/10.1109/ICVD.1996.489481>
dc:identifier DBLP conf/vlsid/BanerjeeCR96 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FICVD.1996.489481 (xsd:string)
dcterms:issued 1996 (xsd:gYear)
rdfs:label Synchronous Test Generation Model for Asynchronous Circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Rabindra_K._Roy>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Savita_Banerjee>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Srimat_T._Chakradhar>
swrc:pages 178-185 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vlsid/1996>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vlsid/BanerjeeCR96/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vlsid/BanerjeeCR96>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vlsid/vlsid1996.html#BanerjeeCR96>
rdfs:seeAlso <https://doi.org/10.1109/ICVD.1996.489481>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vlsid>
dc:title Synchronous Test Generation Model for Asynchronous Circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document