Reformatting Test Patterns for Testing Embedded Core Based System Using Test Access Mechanism (TAM) Switch.
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Reformatting Test Patterns for Testing Embedded Core Based System Using Test Access Mechanism (TAM) Switch.
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Test Access Mechanism, Data acyclic graph, Test patterns, Test time, System-on-Chip
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Reformatting Test Patterns for Testing Embedded Core Based System Using Test Access Mechanism (TAM) Switch.
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