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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vlsid/BhardwajV07>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sarma_B._K._Vrudhula>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sarvesh_Bhardwaj>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FVLSID.2007.11>
foaf:homepage <https://doi.org/10.1109/VLSID.2007.11>
dc:identifier DBLP conf/vlsid/BhardwajV07 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FVLSID.2007.11 (xsd:string)
dcterms:issued 2007 (xsd:gYear)
rdfs:label A Fast and Accurate approach for Full Chip Leakage Analysis of Nano-scale circuits considering Intra-die Correlations. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sarma_B._K._Vrudhula>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sarvesh_Bhardwaj>
swrc:pages 589-594 (xsd:string)
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rdfs:seeAlso <https://doi.org/10.1109/VLSID.2007.11>
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dc:title A Fast and Accurate approach for Full Chip Leakage Analysis of Nano-scale circuits considering Intra-die Correlations. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document