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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vlsid/ChakrabortyA95>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tapan_J._Chakraborty>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Vishwani_D._Agrawal>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FICVD.1995.512075>
foaf:homepage <https://doi.org/10.1109/ICVD.1995.512075>
dc:identifier DBLP conf/vlsid/ChakrabortyA95 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FICVD.1995.512075 (xsd:string)
dcterms:issued 1995 (xsd:gYear)
rdfs:label Robust testing for stuck-at faults. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tapan_J._Chakraborty>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Vishwani_D._Agrawal>
swrc:pages 42-46 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vlsid/1995>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vlsid/ChakrabortyA95/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vlsid/ChakrabortyA95>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vlsid/vlsid1995.html#ChakrabortyA95>
rdfs:seeAlso <https://doi.org/10.1109/ICVD.1995.512075>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vlsid>
dc:subject combinational circuits; logic testing; sequential circuits; fault diagnosis; delays; logic circuit testing; robust testing; fault models; circuit models; d-robust tests; single stuck-at faults; combinational circuit; sequential circuits (xsd:string)
dc:title Robust testing for stuck-at faults. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document