Deriving Signal Constraints to Accelerate Sequential Test Generation. | D2R Server publishing the DBLP Bibliography Database, hosted at L3S Research Center

Property	Value
dcterms:bibliographicCitation	<http://dblp.uni-trier.de/rec/bibtex/conf/vlsid/ChakradharGR97>
dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Srimat_T._Chakradhar>
dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Steven_G._Rothweiler>
dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Vijay_Gangaram>
foaf:homepage	<http://dx.doi.org/doi.org%2F10.1109%2FICVD.1997.568182>
foaf:homepage	<https://doi.org/10.1109/ICVD.1997.568182>
dc:identifier	DBLP conf/vlsid/ChakradharGR97 (xsd:string)
dc:identifier	DOI doi.org%2F10.1109%2FICVD.1997.568182 (xsd:string)
dcterms:issued	1997 (xsd:gYear)
rdfs:label	Deriving Signal Constraints to Accelerate Sequential Test Generation. (xsd:string)
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/Srimat_T._Chakradhar>
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/Steven_G._Rothweiler>
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/Vijay_Gangaram>
swrc:pages	488-494 (xsd:string)
dcterms:partOf	<https://dblp.l3s.de/d2r/resource/publications/conf/vlsid/1997>
owl:sameAs	<http://bibsonomy.org/uri/bibtexkey/conf/vlsid/ChakradharGR97/dblp>
owl:sameAs	<http://dblp.rkbexplorer.com/id/conf/vlsid/ChakradharGR97>
rdfs:seeAlso	<http://dblp.uni-trier.de/db/conf/vlsid/vlsid1997.html#ChakradharGR97>
rdfs:seeAlso	<https://doi.org/10.1109/ICVD.1997.568182>
swrc:series	<https://dblp.l3s.de/d2r/resource/conferences/vlsid>
dc:subject	fault diagnosis, sequential test generation algorithm acceleration, signal constraints, large sequential circuits, deterministic sequential test generation, signal constraint computation technique, line probabilities, line justification techniques, symbolic simulation, benchmark sequential circuits, test generation time reduction, fault coverage, production sequential circuits, truth table, 3-valued signal probabilities (xsd:string)
dc:title	Deriving Signal Constraints to Accelerate Sequential Test Generation. (xsd:string)
dc:type	<http://purl.org/dc/dcmitype/Text>
rdf:type	swrc:InProceedings
rdf:type	foaf:Document