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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vlsid/ChatterjeeKN96>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Abhijit_Chatterjee>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Bruce_C._Kim>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Naveena_Nagi>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FICVD.1996.489490>
foaf:homepage <https://doi.org/10.1109/ICVD.1996.489490>
dc:identifier DBLP conf/vlsid/ChatterjeeKN96 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FICVD.1996.489490 (xsd:string)
dcterms:issued 1996 (xsd:gYear)
rdfs:label Low-cost DC built-in self-test of linear analog circuits using checksums. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Abhijit_Chatterjee>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bruce_C._Kim>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Naveena_Nagi>
swrc:pages 230-233 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vlsid/1996>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vlsid/ChatterjeeKN96/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vlsid/ChatterjeeKN96>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vlsid/vlsid1996.html#ChatterjeeKN96>
rdfs:seeAlso <https://doi.org/10.1109/ICVD.1996.489490>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vlsid>
dc:subject built-in self test; analogue integrated circuits; fault diagnosis; transfer functions; integrated circuit testing; DC built-in self-test; linear analog circuits; checksums; fault classes; catastrophic failures; line opens; matrix representations; DC transfer function; on-chip fault detection; BIST circuitry (xsd:string)
dc:title Low-cost DC built-in self-test of linear analog circuits using checksums. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document