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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vlsid/ChenCC95>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ching-Hwa_Cheng>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jwu-E_Chen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yung-Yuan_Chen>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FICVD.1995.512137>
foaf:homepage <https://doi.org/10.1109/ICVD.1995.512137>
dc:identifier DBLP conf/vlsid/ChenCC95 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FICVD.1995.512137 (xsd:string)
dcterms:issued 1995 (xsd:gYear)
rdfs:label An efficient switching network fault diagnosis for reconfigurable VLSI/WSI array processors. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ching-Hwa_Cheng>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jwu-E_Chen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yung-Yuan_Chen>
swrc:pages 349-354 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vlsid/1995>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vlsid/ChenCC95/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vlsid/ChenCC95>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vlsid/vlsid1995.html#ChenCC95>
rdfs:seeAlso <https://doi.org/10.1109/ICVD.1995.512137>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vlsid>
dc:subject reconfigurable architectures; VLSI; wafer-scale integration; parallel architectures; fault diagnosis; switching networks; switching network fault diagnosis; reconfigurable VLSI/WSI array processors; switching network defects; killing error; multiple faults; testing circuit overhead; testing quality; diagnosis time; mesh array (xsd:string)
dc:title An efficient switching network fault diagnosis for reconfigurable VLSI/WSI array processors. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document