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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vlsid/DasCB98>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Bhargab_B._Bhattacharya>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Debesh_K._Das>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Indrajit_Chaudhuri>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FICVD.1998.646603>
foaf:homepage <https://doi.org/10.1109/ICVD.1998.646603>
dc:identifier DBLP conf/vlsid/DasCB98 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FICVD.1998.646603 (xsd:string)
dcterms:issued 1998 (xsd:gYear)
rdfs:label Design of an Optimal Test Pattern Generator for Built-in Self Testing of Path Delay Faults. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bhargab_B._Bhattacharya>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Debesh_K._Das>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Indrajit_Chaudhuri>
swrc:pages 205- (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vlsid/1998>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vlsid/DasCB98/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vlsid/DasCB98>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vlsid/vlsid1998.html#DasCB98>
rdfs:seeAlso <https://doi.org/10.1109/ICVD.1998.646603>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vlsid>
dc:subject Built-in self-test, delay faults, robust testing, TPG, two-pattern tests. (xsd:string)
dc:title Design of an Optimal Test Pattern Generator for Built-in Self Testing of Path Delay Faults. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document