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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vlsid/DasGJN96>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Amiya_R._Nayak>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Nishith_Goel>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sunil_R._Das>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Wen-Ben_Jone>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FICVD.1996.489629>
foaf:homepage <https://doi.org/10.1109/ICVD.1996.489629>
dc:identifier DBLP conf/vlsid/DasGJN96 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FICVD.1996.489629 (xsd:string)
dcterms:issued 1996 (xsd:gYear)
rdfs:label Syndrome signature in output compaction for VLSI BIST. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Amiya_R._Nayak>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Nishith_Goel>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sunil_R._Das>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Wen-Ben_Jone>
swrc:pages 337-338 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vlsid/1996>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vlsid/DasGJN96/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vlsid/DasGJN96>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vlsid/vlsid1996.html#DasGJN96>
rdfs:seeAlso <https://doi.org/10.1109/ICVD.1996.489629>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vlsid>
dc:subject VLSI; built-in self test; integrated circuit testing; combinational circuits; logic testing; data compression; switching functions; syndrome signature; output compaction; VLSI BIST; exhaustive testing; input patterns; n-input combinational circuit; primary syndrome; subsyndromes; subfunctions; single-output circuit; multiple output (xsd:string)
dc:title Syndrome signature in output compaction for VLSI BIST. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document