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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/vlsid/DasHJN95>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Amiya_R._Nayak>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/H._T._Ho>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sunil_R._Das>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Wen-Ben_Jone>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FICVD.1995.512147>
foaf:homepage <https://doi.org/10.1109/ICVD.1995.512147>
dc:identifier DBLP conf/vlsid/DasHJN95 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FICVD.1995.512147 (xsd:string)
dcterms:issued 1995 (xsd:gYear)
rdfs:label An improved output compaction technique for built-in self-test in VLSI circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Amiya_R._Nayak>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/H._T._Ho>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sunil_R._Das>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Wen-Ben_Jone>
swrc:pages 403-407 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/vlsid/1995>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/vlsid/DasHJN95/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/vlsid/DasHJN95>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/vlsid/vlsid1995.html#DasHJN95>
rdfs:seeAlso <https://doi.org/10.1109/ICVD.1995.512147>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/vlsid>
dc:subject VLSI; integrated circuit testing; combinational circuits; logic testing; integrated logic circuits; design for testability; automatic testing; probability; Boolean functions; built-in self test; digital integrated circuits; output compaction technique; built-in self-test; VLSI circuits; space compression technique; digital circuits; compaction tree generation; detectable error probability; Boolean difference method; syndrome counter; combinational circuits; fault coverage; BIST; DFT (xsd:string)
dc:title An improved output compaction technique for built-in self-test in VLSI circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document